MetMap Integrated Metrology for Additive Manufacturing is the second of two conferences being held as part of a road mapping project to define the

future of integrated metrology in advanced manufacturing in the UK.

MetMap defines integrated metrology as any measurement that is made in relation to the manufacture of a product. This is divided into the following

sub-themes: in-process, on-machine, in-line and in-situ (defined here).

Academic and industrial experts will present and promote key advances in integrated additive manufacturing metrology and establish any additional critical

requirements from UK industrial users and manufacturers.

A keynote speaker will set the scene and review the future, followed by state-of-the-art reviews and regular talks.

Presentations will be invite only, but if you feel you can contribute, please contact the organisers. A limited number of exhibitions will be available for companies. For general enquiries or to request an exhibition, please contact Andrew Dickins (Andrew.Dickins@nottingham.ac.uk).